Role Name: API/Mobile Software Development Engineer in Test (SDET) Retail Technology Work site: Camp Hill, US (Onsite) QA Engineer with strong hands-on experience in API/Mobile Manual Testing and Automation within a Retail/E-commerce environment . The role is focused on Mobile
Bist du ein begeisterter Softwareentwickler, der bei spannenden Projekten im Bankensektor mitarbeiten und diese massgeblich mitprägen möchte? Dann bist du bei uns genau richtig! Unser Bereich Development betreut das Herzstück von Finnova, unsere Kernbankensoftware. Dazu zählt die
Software Engineer Rechnungswesen, Buchungssystem & Kontoabschluss (all) 80‑100 % Willst du den Drive mit uns leben und neue Wege gehen? Bestehendes mit Neuem verknüpfen? Es wartet auf dich ein Team, das gerne lacht, zusammen tüftelt und auf deine Kreativität baut. Unser
Description : The opportunity Join our Product Evaluation & Qualification team at Hitachi Energy Semiconductors in Lenzburg, where we ensure the highest quality and reliability standards for next-generation semiconductor chips and power modules. Our products play
Description : The opportunity In our Product Evaluation and Qualification team (PEQ) at Hitachi Energy Semiconductors, we ensure the reliability and robustness of semiconductor devices through advanced testing and analysis. We offer an internship at the
Finnova is seeking a dedicated individual to advance our Core Suite in a Swiss banking software context. You will drive business analyses, gather stakeholder requirements, define MVPs and user stories, and co‑lead agile development in a Scrum team.
Job Description: The opportunity In our Product Evaluation and Qualification team (PEQ) at Hitachi Energy Semiconductors, we ensure the reliability and robustness of semiconductor devices through advanced testing and analysis. We offer an internship at the
R&D Internship in Software Engineering and Data Analysis 80 - 100 % (f/m/d) In our Product Evaluation and Qualification team (PEQ) at Hitachi Energy Semiconductors, we ensure the reliability and robustness of semiconductor devices through advanced testing